NANO Integrated Solutions, Inc
EAG
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Home Services Debug

We provide a complete line of debug services including sample preparation, sample analysis, fault isolation, and circuit modifications for customer requests ranging from basic electrical characterization to complete re-design. Our full range of debug tools enables you to solve even the most vexing logic failures and other anomalies.
Device Debug Service Include:
FIB Front-side Circuit Edit
FIB Back-side Circuit Edit
Back-side Sample Thinning
Design for Debug
Mechanical and E-Beam Probing
Optical Imaging
Decapsulation and Encapsulation
Dry-etch (Plasma and RIE)
Dual-Beam (FIB/SEM) Cross-sectioning and Imaging
Hot Spot Analysis / Thermal Mapping / Photo Emission
Back-side (IREM) / Time Resolved Emission /TIVA, LIVA
 
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