NANO Integrated Solutions, Inc
EAG
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Home Services Failure Analysis

We provide a complete line of failure analysis services for IC devices, packaged devices and printed circuit boards including electrical tests, electrical failure isolations, physical failure isolation, reverse engineering and construction analysis.
 
Failure Analysis Services Include:
Liquid Crystal (LC) Analysis
OBIC/EBIC/IBIC
LSIM Fault Detection (LIVA/TIVA)
Emission Analysis (EMMI/IREM)
TRE/EMMI Scope
SCM/AFM/SPM
EDS/EELS
Real-time X-ray (RTX)
Scanning Acoustic Microscopy (CSAM)
Decapsulation
Deprocessing
Dry/Wet Etch
Optical Imaging
Cross-sectional Sample Preparation
Reverse Engineering/Construction Analysis
 
 
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