NANO Integrated Solutions, Inc
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Home Services Test Services

Test Services include Test Development, Test Consulting (Design for Test, Design for Manufacture and Yield Enhancement), Test Training to name a few specific areas. Nano Integrated Solutions, Inc has been a key provider of test training and consultation for over 10 years. Thousands of test engineers worldwide have been trained by our own test engineering experts. Our test support includes:

Test Development - (Memory, RF, Digital, Mixed Signal) – Gigabit Testing to 12.8 Gb/s (PCI, Serdes, 1394B, HX) Characterization and Production ASIC Test programs using the Verigy V93000 SoC test platform (formerly Agilent and HP93000). Design and build probe cards and load boards for IC test. Support is also available for HP83000 and F660 platforms.

 
Testers (In-House)

Tester # 1

Model

Channels

Memory

Options

DPS

V 93000

P1000

1024

112M

 

6-GPDPS

 

Total

1024

 

 

2-HCDPS

 

 

 

 

 

 

Tester # 2

Model

Channels

Memory

Options

DPS

V 93000

P1000

160

112M

TIA

6-GPDPS

 

P1000

352

56M

MCA

2-HCDPS

 

NP2500

64

112M

BIST ASSIST

 

 

Total

576

 

WGA

 

 

 

 

 

WGB

 

 

 

 

 

WDA

 

 

 

 

 

WDB

 

 

 

 

 

 

 

Tester # 3

Model

Channels

Memory

Options

DPS

V 93000

P1000

32

112M

WGA

8-GPDPS

 

P1000

224

56M

WGB

 

 

NP2500

16

112M

 

 

 

Total

272

 

 

 

 

 

 

 

 

 

Tester # 4

Model

Channels

Memory

Options

DPS

V 93000

PS3600

256

64M

MCX

2-MSDPS

Pin Scale

PS800

512

64M

HXA

1-HCDPS

 

 

 

 

HXA

5-GPDPS

 

 

 

 

PPTIA

 

 

Total

768

 

 

 

 

 

 

 

 

 

Tester # 6

Model

Channels

Memory

Options

DPS

V 93000

PS400

128

64M

RF

2-MSDPS

Port Scale RF

 

 

 

 

 

 

Total

128

 

 

 

 

 

 

 

 

 

Tester # 7

Model

Channels

Memory

Options

DPS

83000

F330

160

8M

SWI

1-PDPS

 

SCAN

4

256M

SCM

1-DPS

 

 

 

 

 

 

Total

164

 

 

 

 

 

 

 

 

 

Tester # 8

Model

Channels

Memory

Options

DPS

83000

F240

384

4M

 

1-PDPS

 

SCAN

4

256M

1-DPS

 

 

 

 

 

 

Total

388

 

 

 

 

 

 

 

 

 

Tester # 9

Model

Channels

Memory

Options

DPS

83000

F660

160

4M

F1300

1-PDPS

 

 

 

 

 

1-DPS

 

Total

160

 

 

 

 
 
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