Nano ISI provides leading edge Turnkey Semiconductor Test Solutions.
Our team of Engineers have deep domain experience in the following
areas: |
| |
| Test Applications: |
 |
RTL design and synthesis, FPGA implementation. |
|
DFT insertion and vector generation. |
|
Test Hardware Design, including probe cards, DUT boards,
handler change kits, and burn in boards. |
|
Initial proto debug and Production test program development. |
| |
 |
High Speed Digital (12Gb/sec, PCI, PCI2, DDR2, DDR3) |
| |
|
Mixed Signal DAC/ADC, Power Management chips |
| |
|
RF |
| |
|
Memory |
| |
|
SIP/Stacked die |
|
Characterization program development and fast/slow
corner lot analysis. |
|
Product Engineering including yield analysis, yield
ramp, and Return Material Analysis. |
|
Release to production. |
|
Correlation of probe yield to fab parameters. |
|
Program Management to track and document the release
process. |
|
Test Time Reduction. |
| |
|
| Prototype testing: |
|
Wafer sort (8inch and 12 inch, with or without heat) |
|
Manual or automatic package test with temperature
control (Temptronics, Silicon Thermal, and Seiko-Epson quad site handler) |
| |
|
Engineering tester rental |
| |
|
Services 